| Standard | Focus | Key Difference | |----------|-------|----------------| | | General performance testing of process instruments | Broad influence & dynamic tests | | ISO 9001 | Quality management system | Not device-specific | | IEC 61508/61511 | Functional safety (SIL) | Includes systematic capability + random failures | | NAMUR NE 107 | Device diagnostics | Only for failure handling | | ANSI/ISA 75.02 | Control valve flow testing | Only for valves | | ASTM E74 | Force transducer calibration | Only calibration, not environmental |
In response to these challenges, the IEC is continually updating and expanding IEC 61298 to address emerging needs and technologies.
: To write performance requirements into contracts, ensuring they buy equipment that won't fail in critical applications. iTeh Standards iec 612982
Whether you are aligning with the older or preparing for the newer ED3 / 2026 framework ?
+-------------------------------------------------------------+ | IEC 61298-2 Standard Environment | | | | [ Controlled Temp ] [ Stable Humidity ] [ Clean Power ] | | | | | | +---------------------+-------------------+ | | v | | +-------------------------+ | | | Isolated Performance | | | | Characteristics | | | +-------------------------+ | +-------------------------------------------------------------+ | Standard | Focus | Key Difference |
If you were looking for information on (often called "solid posts" in substation engineering), these are typically covered by different standards:
This standard specifies general methods for conducting tests and reporting the functional and performance characteristics of process measurement and control devices. It applies to both analogue and digital devices. Use IEC 62443 or Namur NE107 for that
Does not test predictive maintenance features (e.g., NE107 diagnostic status, asset health indices). Use IEC 62443 or Namur NE107 for that.
This test evaluates how closely the output of the device follows a straight-line relationship with the input over its specified range. 3. Hysteresis
The standard defines several technical metrics used to judge the performance of a device under test (DUT). Key terms and definitions includes:
Note: As of June 2026, an update (Edition 3.0) is under development, indicating the ongoing refinement of these standards to meet new technology demands.